Progress of Scanning Electron Microscopy (SEM) and Electron Probe Microanalysis (EPMA) for Pulp and Paper Specimens. (Part 3). Application of EPMA Color Mapping. (1).
نویسندگان
چکیده
منابع مشابه
Electron Probe Microanalysis (EPMA)
An electron microprobe is an electron microscope designed for the non-destructive x-ray microanalysis and imaging of solid materials. It is essentially a hybrid instrument combining the capabilities of both the scanning electron microscope (SEM) and an x-ray fluorescence spectrometer (XRF), with the added features of fine-spot focusing (~ 1 micrometer), optical microscope imaging, and precision...
متن کاملScanning Electron Microscopy (SEM) analysis and biological control of Ixodes ricinus using entomopathogenic fungi
In the present study, pathogenicity of four native strains of Entomopathogenic fungus; Metarhizium anisopliae, was studied against adult stage of Ixodes ricinus. For this purpose a total number of 180 adult ticks were examined in triplicate. Thirty ticks for each strain and negative and positive controls were immersed in 2.4×107 fungal conidia/ml in vitro. Samples were incubated in separate Pet...
متن کاملcellular behavior and scanning electron microscope evaluation of pro-root mta, root mta and modified mta on fibroblast l929
چکیده ندارد.
15 صفحه اولMorphological and histochemical investigation of the camel (Camelus dromedarius) abomasal mucous membrane by light and scanning electron microscopy (SEM)
Morphological and histochemical study of the abomasal epithelium in camel (Camelus dromedarius) wascarried out by light and scanning electron microscopes. The lining of the abomasum was divided into fourregions, i.e. cardiac, pseudocardiac, fundic and pyloric. Our investigation revealed that the cardiac andpseudocardiac regions occupy a wide part of the abomasum in camel and it reaches approxim...
متن کاملBarriers to Quantitative Electron Probe X-Ray Microanalysis for Low Voltage Scanning Electron Microscopy
Low voltage x-ray microanalysis, defined as being performed with an incident beam energy ≤5 keV, can achieve spatial resolution, laterally and in depth, of 100 nm or less, depending on the exact selection of beam energy and the composition of the target. The shallow depth of beam penetration, with the consequent short path length for x-ray absorption, and the low overvoltage, the ratio of beam ...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: JAPAN TAPPI JOURNAL
سال: 2000
ISSN: 0022-815X,1881-1000
DOI: 10.2524/jtappij.54.229